[PDF.51zn] 2001 IEEE International Reliability Physics Symposium Proceedings: 39th Annual Orlando, Florida; April 30 - May 3, 2001

2001 IEEE International Reliability Physics Symposium Proceedings: 39th Annual Orlando, Florida; April 30 - May 3, 2001

[PDF.ek82] 2001 IEEE International Reliability Physics Symposium Proceedings: 39th Annual Orlando, Florida; April 30 - May 3, 2001

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 | #18285539 in Books |  2001-06 | Original language:English |  10.75 x8.00 x.75l, | File type: PDF | 474 pages

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Based on a reliability physics symposium, this CD-ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.

You can specify the type of files you want, for your gadget.2001 IEEE International Reliability Physics Symposium Proceedings: 39th Annual Orlando, Florida; April 30 - May 3, 2001   |  From Ieee. I was recommended this book by a dear friend of mine.

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