[PDF.29ec] Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)

Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)

[PDF.zh23] Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)

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 | #11940743 in Books |  1997-12-31 | Original language:English | PDF # 1 |  10.00 x6.75 x1.25l, | File type: PDF | 324 pages

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Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building...

You can specify the type of files you want, for your gadget.Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)   |  Manoj Sachdev. I really enjoyed this book and have already told so many people about it!

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