[PDF.22oy] Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)

Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)

[PDF.ob38] Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)

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 | #14984370 in Books |  1993-08-31 | Original language:English | PDF # 1 |  9.21 x.56 x6.14l,1.05 | File type: PDF | 180 pages

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

You can specify the type of files you want, for your device.Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)   |  Eugene R. Hnatek. I really enjoyed this book and have already told so many people about it!

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