[PDF.23vn] Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

[PDF.xu81] Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

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 | #13765186 in Books |  1999-12 | Original language:English |  11.50 x8.25 x.50l, | File type: PDF | 212 pages

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Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.

You can specify the type of files you want, for your device.Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits   |  From Ieee. I was recommended this book by a dear friend of mine.

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