[PDF.38ws] The Effect of Nuclear Reactions on Integrated Circuit Reliability: CHARGE GENERATION BY SECONDARY PARTICLES FROM NUCLEAR REACTIONS IN BACK END OF LINE MATERIALS

The Effect of Nuclear Reactions on Integrated Circuit Reliability: CHARGE GENERATION BY SECONDARY PARTICLES FROM NUCLEAR REACTIONS IN BACK END OF LINE MATERIALS

[PDF.en46] The Effect of Nuclear Reactions on Integrated Circuit Reliability: CHARGE GENERATION BY SECONDARY PARTICLES FROM NUCLEAR REACTIONS IN BACK END OF LINE MATERIALS

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 |  2010-03-02 | Original language:English | PDF # 1 |  8.66 x.13 x5.91l,.21 | File type: PDF | 56 pages

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Direct charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which...

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